X-Ray Line Profile Analysis in Materials Science
In stockBuy More Save More!
The more you buy, the more you save
X-Ray Line Profile Analysis in Materials Science
$140.00
X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials.
Supporting research in the area of x-ray line profile analysis is necessary in promoting further developments in this field. X-Ray Line Profile Analysis in Materials Science aims to synthesize the existing knowledge of the theory, methodology, and applications of x-ray line profile analysis in real-world settings. This publication presents both the theoretical background and practical implementation of x-ray line profile analysis and serves as a reference source for engineers in various disciplines as well as scholars and upper-level students.
Book Details
- Author: Jen Gubicza
- Publisher: Engineering'science Reference
- eBook ISBN: 9781466658530, 1466658533
- Print ISBN: 9781466658523, 1466658525
- Other ISBNs: 9781466658547
